Sub-arcsecond differential deflectometry to measure thermally induced distortions of the Swift optical bench

Sub-arcsecond differential deflectometry to measure thermally induced distortions of the Swift optical bench

Author(s):

Leviton, D.B. ( NASA Goddard Space Flight Ctr.(USA) )
Frey, B.J.
Madison, L.E.
Parker, J.A.
Sheinman, O.E.

Publication title:

X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4851

Pub. Year:

2003

Vol.:

Part One

Page(from):

587

Page(to):

598

Pages:

12

Pub. info.:

Bellingham WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446305 [0819446300]

Language:

English

Call no.:

P63600/4851

Type:

Conference Proceedings

Details

TDL ID:	ZA00012694
Series ID:	PA00000029
Conf. info. (Name):	Astronomical Telescopes and Instrumentation : X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
Conf. info. (Number):	2002
Conf. info. (Venue):	Waikoloa, Hawaii, USA
Conf. info. (Date):	2002.08.24-2008.08.28

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