High-S/N high-resolution image slicer observations with UVES

High-S/N high-resolution image slicer observations with UVES

Author(s):

Dekker, H. ( European Southern Observatory (Germany) )

Nissen, P. E. ( Univ. of Aarhus (Denmark) )

Kaufer, A. ( European Southern Observatory (Chile) )

Primas, F. ( European Southern Observatory (Germany) )

D'Odorico, S.

Hanuschik, R. W.

1 more

Publication title:

Specialized optical developments in astronomy :25-26 August 2002, Waikoloa, Hawaii, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4842

Pub. Year:

2003

Page(from):

139

Page(to):

150

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446213 [0819446211]

Language:

English

Call no.:

P63600/4842

Type:

Conference Proceedings

Details

TDL ID:	ZA00012684
Series ID:	PA00000029
Conf. info. (Name):	Astronomical Telescopes and Instrumentation : Specialized optical developments in astronomy
Conf. info. (Number):	2002
Conf. info. (Venue):	Waikoloa, HI, USA
Conf. info. (Date):	2002.08.25-2002.08.26

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