SMATR precision interferomstry at 794 nm

SMATR precision interferomstry at 794 nm

Author(s):

Monnier, J.D. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )

Berger, J.-P. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )

Millan-Gabet, R. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )

Traub, W.A. ( Harvard-Smithsonian Ctr. for Astrophysics (USA) )

Carleton, N.P.

Pedretti, E.

Coldwell, C.M.

Papaliolios, C.D. ( Harvard Univ. (USA) )

3 more

Publication title:

Interferometry for Optical Astronomy II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4838

Pub. Year:

2003

Vol.:

Part Two

Page(from):

1127

Page(to):

1138

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446176 [0819446173]

Language:

English

Call no.:

P63600/4838

Type:

Conference Proceedings

Details

TDL ID:	ZA00012677
Series ID:	PA00000029
Conf. info. (Name):	Astronomical Telescopes and Instrumentation : Interferometry for Optical Astronomy
Conf. info. (Number):	2002 : 2nd
Conf. info. (Venue):	Waikoloa, HI, USA
Conf. info. (Date):	2002.08.22-2002.08.28

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