New concept for wide-field imaging
- Author(s):
- Montilla, I. ( Technische Univ. Delft (Netherlands) )
- Bakker, E.J. ( Leiden Observatory/Univ. Leiden (Netherlands) )
- Pereira, S.F. ( Technische Univ. Delft (Netherlands) )
- Braat, J.J.M.
- Publication title:
- Interferometry for Optical Astronomy II
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4838
- Pub. Year:
- 2003
- Vol.:
- Part One
- Page(from):
- 416
- Page(to):
- 424
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819446176 [0819446173]
- Language:
- English
- Call no.:
- P63600/4838
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Experimental verification of field extension for nonhomothetic arrays with a pupil-plane interferometer
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Wide field spectrograph concepts for the European Extremely Large Telescope [6269-90]
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Nulling interferometry for exoplanet detection using polarization properties [6268-48]
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Effect of obstructions on the design of reflective ring-field projection systems
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Vectorial analysis of polarization issues in multi-axial nulling interferometers for exoplanet detection
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
Experimental performance of homothetic mapping for wide-field interferometric imaging
SPIE - The International Society of Optical Engineering |