High-resolution index of refraction profiling of optical waveguides (Invited Paper)

High-resolution index of refraction profiling of optical waveguides (Invited Paper)

Author(s):

Publication title:

Applications of photonic technology 5 : closing the gap between theory, development, and application : Photonics North 2002

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4833

Pub. Year:

2002

Page(from):

811

Page(to):

819

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446121 [0819446122]

Language:

English

Call no.:

P63600/4833

Type:

Conference Proceedings

Details

TDL ID:	ZA00012670
Series ID:	PA00000029
Conf. info. (Name):	ICAPT - International Conference on Applications of Photonic Technology
Conf. info. (Number):	2002 : 5th
Conf. info. (Venue):	Quebec, QC, Canada
Conf. info. (Date):	2002.06.16

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