Current projects in display metrology at the NIST flat panel display laboratory

Current projects in display metrology at the NIST flat panel display laboratory

Author(s):

Boynton, P.A. ( National Institute of Standards and Technology (USA) )
Kelley, E.F.
Libert, J.M.

Publication title:

Fourth Oxford Conference on Spectroscopy : 10-12 June 2002, Davidson, North Carolina, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4826

Pub. Year:

2003

Page(from):

165

Page(to):

175

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446008 [0819446009]

Language:

English

Call no.:

P63600/4826

Type:

Conference Proceedings

Details

TDL ID:	ZA00012664
Series ID:	PA00000029
Conf. info. (Name):	Oxford Conference on Spectroscopy
Conf. info. (Number):	2002 : 4th
Conf. info. (Venue):	Davidson, NC. USA
Conf. info. (Date):	2002.06.10-2002.06.12

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