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NPL correction kit for enhanced and traceable reflectance measurement

Author(s):
Clarke, P.J. ( National Physical Lab. (United kingdom) )  
Publication title:
Fourth Oxford Conference on Spectroscopy : 10-12 June 2002, Davidson, North Carolina, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4826
Pub. Year:
2003
Page(from):
123
Page(to):
128
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446008 [0819446009]
Language:
English
Call no.:
P63600/4826
Type:
Conference Proceedings

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