Si nanostructures embedded in SiO2: electronic and optical properties

Si nanostructures embedded in SiO2: electronic and optical properties

Author(s):

Ossicini, S. ( INFM (Italy) )
Degoli, E. ( Univ. degli Studi di Modena e Reggio Emilia (Italy) )
Luppi, M.
Magri, R.

Publication title:

Optical properties of nanocrystals : 9-11 July 2002, Seattle, Washington, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4808

Pub. Year:

2002

Page(from):

73

Page(to):

84

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445766 [0819445762]

Language:

English

Call no.:

P63600/4808

Type:

Conference Proceedings

Details

TDL ID:	ZA00012645
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Optical Properties of Nanocrystals
Conf. info. (Number):	2002
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.09-2002.07.11

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