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Analysis of electron scattering in thin dielectric films used as ion barriers in Generation III image tubes

Author(s):
Publication title:
Low-light-level and real-time imaging systems, components, and applications :9-11 July 2002, Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4796
Pub. Year:
2003
Page(from):
23
Page(to):
32
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445636 [0819445630]
Language:
English
Call no.:
P63600/4796
Type:
Conference Proceedings

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