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Optical and electronic characterization on HgCdTe materials

Author(s):
Chu, J.H. ( Shanghai Institute of Technical Physics (China) )
Chang, Y.
Huang, Z.M.
Gui, Y.S.
Wang, X.G.
Lu, X.F.
He, L.
Tang, D.Y.
3 more
Publication title:
Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4795
Pub. Year:
2002
Page(from):
52
Page(to):
61
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445629 [0819445622]
Language:
English
Call no.:
P63600/4795
Type:
Conference Proceedings

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