Watermark detectors based on nth order statistics

Watermark detectors based on nth order statistics

Author(s):

Furon, T. ( Univ. catholique de Louvain (Belgium) )
Silvestre, G.C. ( Univ. College Dublin (Ireland) )
Hurley, N.J.

Publication title:

Applications of digital image processing XXV : 8-10 July 2002, Seattle, Washington, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4790

Pub. Year:

2002

Page(from):

180

Page(to):

188

Pages:

9

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445575 [0819445576]

Language:

English

Call no.:

P63600/4790

Type:

Conference Proceedings

Details

TDL ID:	ZA00012627
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Applications of digital image processing
Conf. info. (Number):	2002 : 25th
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.08-2002.07.10

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