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A look ahead in residual stress analysis: the strain imager at the ILL

Author(s):
Bruno, G. ( Manchester Materials Science Ctr. (United Kingdom) )
Pirling, T. ( Institut Laue-Langevin (France) )
Rowe, S.
Hutt, W. ( Manchester Materials Science Ctr. (United Kingdom) )
Withers, P.J. ( Manchester Materials Science Ctr. (United Kingdom) )
Carlile, C.J. ( Institut Laue-Langevin (France) )
1 more
Publication title:
Advances in neutron scattering instrumentation : 7-8 July, 2002, Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4785
Pub. Year:
2002
Page(from):
64
Page(to):
74
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445520 [0819445525]
Language:
English
Call no.:
P63600/4785
Type:
Conference Proceedings

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