Novel photon-counting detectors for x-ray diffraction applications
- Author(s):
Diawara, Y. ( Bruker-AXS Inc. (USA) ) Khazins, D. Medved, S. Becker, B. Durst, R.D. Thorson, T.A. - Publication title:
- X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4784
- Pub. Year:
- 2002
- Page(from):
- 358
- Page(to):
- 364
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445513 [0819445517]
- Language:
- English
- Call no.:
- P63600/4784
- Type:
- Conference Proceedings
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