Effects of p/n inhomogeneity on CdZnTe radiation detectors

Effects of p/n inhomogeneity on CdZnTe radiation detectors

Author(s):

Chu, M. ( Fermionics Corp. (USA) )

Terterian, S.

Ting, D.

James, R.B. ( Brookhaven National Lab. (USA) )

Szawlowski, M. ( Advanced Photonix, Inc. (USA) )

Visser, G.J. ( NOVA R&D, Inc. (USA) )

1 more

Publication title:

X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4784

Pub. Year:

2002

Page(from):

237

Page(to):

243

Pages:

7

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445513 [0819445517]

Language:

English

Call no.:

P63600/4784

Type:

Conference Proceedings

Details

TDL ID:	ZA00012621
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : SPIE Conference on Hard X-ray and Gamma-ray Detector Physics ; Conference on X-ray Detectors
Conf. info. (Number):	2002 : 4th ; 2002
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.07-2002.07.09

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