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Resistivity dependence on Zn concentration in semi-insulating (Cd,Zn)Te

Author(s):
Publication title:
X-ray and gamma-ray detectors and applications IV : 7-9 July Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4784
Pub. Year:
2002
Page(from):
14
Page(to):
20
Pages:
7
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445513 [0819445517]
Language:
English
Call no.:
P63600/4784
Type:
Conference Proceedings

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