Applications of x-ray intensity interferometry

Applications of x-ray intensity interferometry

Author(s):

Yabashi, M. ( Spring-8/Japan Synchrotron Radiation Research Institute (Japan) )
Tamasaku, K. ( Spring-8/RIKEN (Japan) )
Ishikawa, T. ( Spring-8/Japan Synchrotron Radiation Research Institute (Japan) )

Publication title:

X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4782

Pub. Year:

2002

Page(from):

122

Page(to):

131

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445490 [0819445495]

Language:

English

Call no.:

P63600/4782

Type:

Conference Proceedings

Details

TDL ID:	ZA00012619
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : X-Ray Mirrors, Crystals, and Multilayers
Conf. info. (Number):	2002 : 2nd
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.10-2002.07.11

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