Blank Cover Image

Intense source of nanosecond duration 10-KeV to 250-KeV x rays

Author(s):
Publication title:
Advances in laboratory-based X-ray sources and optics III : 8 July, 2002, Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4781
Pub. Year:
2002
Page(from):
42
Page(to):
53
Pages:
12
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445483 [0819445487]
Language:
English
Call no.:
P63600/4781
Type:
Conference Proceedings

Similar Items:

Boyer, C.N., Holland, G.E., Seely, J.F.

SPIE - The International Society of Optical Engineering

Dorchies, F., Blasco, F., Bonte, C., Caillaud, T., Gauthier, J. -C. J., Stenz, C., Stevefelt, J.

SPIE - The International Society of Optical Engineering

Seely, J.F., Hudson, L.T., Weaver, J.L., Holland, G.E., Boyer, C.N.

SPIE-The International Society for Optical Engineering

Seely,J.F., Korde,R.S., Hanser,F.A., Wise,J., Holland,G.E., Weaver,J., Rife,J.C.

SPIE - The International Society for Optical Engineering

Boyer,C.N., Holland,G.E., Seely,J.F.

SPIE-The International Society for Optical Engineering

Seely,J.F., Kowalski,M.P., Cruddace,R.G., Rife,J.C., Barbee,T.W.,Jr., Hunter,W.R., Holland,G.E.

SPIE-The International Society for Optical Engineering

Seely,J.F., Deslattes,R.D., Hudson,L.T., Holland,G.E., Atkin,R., Meyerhofer,D.D., Stoeckl,C.

SPIE-The International Society for Optical Engineering

Aglitskiy,Y., Lehecka,T., Obenschain,S.P., Bodner,S., Pawley,C.J., Gerber,K., Sethian,J., Brown,C.M., Seely,J.F., …

SPIE-The International Society for Optical Engineering

Seely,J.F., Holland,G.E., Boehly,T., Pien,G., Bradley,D.K.

SPIE-The International Society for Optical Engineering

Chen, L.M., Forget, P., Toth, R., Kieffer, J.-C., Krol, A., Chamberlain, C.C., Hou, B.X., Nees, J.A., Mourou, G.A.

SPIE-The International Society for Optical Engineering

Seely, J. F., Back, C. A., Constantin, C., Lee, R. W., Chung, H. -K., Hudson, L. T., Szabo, C. I., Henins, A., Holland, …

SPIE - The International Society of Optical Engineering

Korte,P.A.J.de, Hoevers,H.F.C., Bruijn,M.P., Bento,A.C., Mels,W.A., Bleeker,J.A.M., Holland,A.D., Turner,M.J.T.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12