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Surface and interface roughness in magnetic thin films: a comparison using carbon-nanotube atomic force microscopy and soft-x-ray scattering

Author(s):
Barnes, B.M. ( Univ. of Wisconsin/Madison (USA) )
Flack, F.
Kelly IV, J.J.G.
Lagally, D.P.
Savage, D.E.
Lagally, M.G.
1 more
Publication title:
Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4780
Pub. Year:
2002
Page(from):
61
Page(to):
71
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445476 [0819445479]
Language:
English
Call no.:
P63600/4780
Type:
Conference Proceedings

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