High-precision 2D-angle measurement interferometer
- Author(s):
- Ge, Z. ( Fuji Photo Optical Co., Ltd. (Japan) )
- Takeda, M. ( Univ. of Electro-Communications (Japan) )
- Publication title:
- Interferometry XI: Applications
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4778
- Pub. Year:
- 2002
- Page(from):
- 277
- Page(to):
- 287
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445452 [0819445452]
- Language:
- English
- Call no.:
- P63600/4778
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Precision narrow-angle astrometry of binary stars with the Navy Prototype Optical Interferometer
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
8
Conference Proceedings
Doppler high-precision extra-solar planet surveys by a fixed delay interferometer
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
High Precision Measurement of the Total Z0 Width Using Large Angle e+e- Events
Plenum Press |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Multi-axis interferometer system for vibration measurement with oblique angles
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
High-precision reflectivity measurements: improvements in the calibration procedure
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
High accuracy measurements of long-term stability of material with PTB's Precision Interferometer
Society of Photo-optical Instrumentation Engineers |