Characterization of aspherical micro-optics using digital holography: improvement of accuracy
- Author(s):
- Kebbel, V. ( Bremer Institut fuer Angewandte Strahltechnik (Germany) )
- Mueller, J.
- Jueptner, W.P.O.
- Publication title:
- Interferometry XI: Applications
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4778
- Pub. Year:
- 2002
- Page(from):
- 188
- Page(to):
- 197
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445452 [0819445452]
- Language:
- English
- Call no.:
- P63600/4778
- Type:
- Conference Proceedings
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