Speckle noise reduction in quantitative optical metrology techniques by application of the discrete wavelet transformation

Speckle noise reduction in quantitative optical metrology techniques by application of the discrete wavelet transformation

Author(s):

Furlong, C. ( Worcester Polytechnic Institute (USA) )
Pryputniewicz, R.J.

Publication title:

Interferometry XI: Techniques and Analysis

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4777

Pub. Year:

2002

Page(from):

271

Page(to):

278

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445445 [0819445444]

Language:

English

Call no.:

P63600/4777

Type:

Conference Proceedings

Details

TDL ID:	ZA00012614
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Solid state lighting
Conf. info. (Number):	2002 : 11th
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.08-2002.07.10

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