Advanced topics in source modeling

Advanced topics in source modeling

Author(s):

Kaminski, M.S. ( Breault Research Organization, Inc. (USA) )
Garcia, K.J.
Stevenson, M.A.
Frate, M.E.
Koshel, R.J.

Publication title:

Modeling and Characterization of Light Sources

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4775

Pub. Year:

2002

Page(from):

46

Page(to):

57

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445421 [0819445428]

Language:

English

Call no.:

P63600/4775

Type:

Conference Proceedings

Details

TDL ID:	ZA00012612
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Optical Scanning
Conf. info. (Number):	2002
Conf. info. (Venue):	Seattle, WA, USA
Conf. info. (Date):	2002.07.08-2002.07.09

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