Fundamentals and prospects of ultrashort laser radiation for material processing, surface analysis, and medical applications (Invited Paper)
- Author(s):
- Husinsky, W. ( Vienna Univ. of Technology (Austria) )
- Publication title:
- ALT'01 International Conference on Advanced Laser Technologies, 11-14 September, 2001, Constanta, Romania
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4762
- Pub. Year:
- 2002
- Page(from):
- 326
- Page(to):
- 333
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445285 [0819445282]
- Language:
- English
- Call no.:
- P63600/4762
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Z-scan measurements of two-photon absorption for ultrashort laser radiation
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
Laser ablation and structuring of transparent materials with ultrashort laser pulses (Invited Paper)
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Fundamentals of energy cascade during ultrashort laser-material interactions (Invited Paper)
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
Machining of metals with ultrashort laser pulses: from fundamental investigations to industrial applications (Invited Paper)
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE |
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
Modification of structure and properties of materials by laser surface processing(Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Surface modification of polymer materials by excimer laser processing (Invited Paper)
SPIE-The International Society for Optical Engineering |