Blank Cover Image

Strategies for end-to-end modeling of next-generation mm- and radio telescopes

Author(s):
Publication title:
Workshop on integrated modeling of telescopes : 5-7 February 2002, Lund, Sweden
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4757
Pub. Year:
2002
Page(from):
162
Page(to):
168
Pages:
7
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445216 [0819445215]
Language:
English
Call no.:
P63600/4757
Type:
Conference Proceedings

Similar Items:

Mosier,G.E., Femiano,M., Ha,K., Bely,P.Y., Burg,R., Redding,D.C., Kissil,A., Rakoczy,J., Craig,L.

SPIE-The International Society for Optical Engineering

Plathner,D.E.K.

SPIE-The International Society for Optical Engineering

Craig,L., Cuerden,B., Jacobson,D.N., Kissil,A., Mehle,G.V., Mosier,G.E., Nein,M.E., Page,T., Pitalo,K., Redding,D.C., …

SPIE - The International Society for Optical Engineering

Burgarella, D., Dohle, K., Ferrari, M., Zamkotsian, F., Hammer, F., Sayede, F., Rigaud, F.

SPIE-The International Society for Optical Engineering

Mosier,G.E., Femiano,M., Ha,K., Bely,P.Y., Burg,R., Redding,D.C., Kissil,A., Rakoczy,J., Craig,L.

SPIE-The International Society for Optical Engineering

Weck,O.L.de, Miller,D.W., Mallory,G.J., Mosier,G.E.

SPIE - The International Society for Optical Engineering

Martin,F., Lesyna,L., LeRoy,R.J., Menzel,M.T., Andersen,G.C., Hyatt,B., Triebes,K.J., Rudiger,C., Stier,M.T., Cox,C.D., …

SPIE - The International Society for Optical Engineering

Dodson,K.J., Mehle,G.V., Kasl,E.P.

SPIE - The International Society for Optical Engineering

Bely,P.Y., Petro,L., Mehalick,K.I., Perrygo,C.M.

SPIE-The International Society for Optical Engineering

Mehle,G.V., Dodson,K.J., Ruch,E.

SPIE - The International Society for Optical Engineering

Redding,D.C., Basinger,S.A., Lowman,A.E., Kissil,A., Bely,P.Y., Burg,R., Lyon,R.G., Mosier,G.E., Femiano,M., …

SPIE-The International Society for Optical Engineering

12 Conference Proceedings Next-generation mask metrology tool

Schlueter, G., Roeth, K.-D., Blaesing-Bangert, C., Ferber, M.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12