Blank Cover Image

Environmental test bench for reliability studies: influence of the temperature on rf switches with metallic membranes

Author(s):
Lafontan, X. ( MEMScAP S.A. (France) )
Le Touze, C.
Wenk, B.
Kolesnik, I.
Pressecq, F. ( Ctr. National d'Etudes Spatiales (France) )
Perez, G.
Nicot, J.-M.
Dardalhon, M.
Rigo, S.
4 more
Publication title:
Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4755
Pub. Year:
2002
Page(from):
624
Page(to):
633
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445186 [0819445185]
Language:
English
Call no.:
P63600/4755
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Reliability issues of an accelerometer under environmental stresses

Schmitt, P., Pressecq, F., Perez, G., Lafontan, X., Nicot, J.M., Esteve, D., Fourniols, J.Y., Camon, H., Oudea, C.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings MEMS physical analysis in order to complete experimental results return

Lafontan,X., Dufaza,C., Perez,G., Pressecq,F.

SPIE - The International Society for Optical Engineering
2 Conference Proceedings RF MEMS microswitches design and characterization

Lafontan,X., Dufaza,C., Robert,M., Perez,G., Pressecq,F.

SPIE-The International Society for Optical Engineering
8 Technical Paper MEMS Reliability: From Experimental Results to the Understanding of Physical Phenomena

Pressecq, F., Schmitt, P., Veyrie, D., Duong, Q., Lafontan, X., Lellouchi, D.

American Institute of Aeronautics and Astronautics
3 Conference Proceedings Physical and reliability issues in MEMS microrelays with gold contacts

Lafontan,X., Pressecq,F., Perez,G., Dufaza,C., Karam,J.-M.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Theoretical study of surface MEMS RF switch structure

Jia,M., Guo,F., Zhu,Z., Lai,Z., Chu,J., Wang,Y., Ge,X., Yang,Y.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings "Concepts, characterization, and modeling of MEMS microswitches with gold contacts in MUMPs"

Lafontan,X., Dufaza,C., Robert,M., Pressecq,F., Perez,G.

SPIE-The International Society for Optical Engineering
10 Technical Paper Closed-Loop Control of a Bench Test Drive System for Automotive Shock Absorbers

M. Vandresen, C.B.S. Dutra, M.F. Almeida, V.G. Sbardelotto

Society of Automotive Engineers
5 Technical Paper Space Microsystems and Reliability: The Contribution of Behavioral Modeling

Schmitt, P., Nicot, J., Pressecq, F., Lafontan, X., Oudea, C., Esteve, D.

American Institute of Aeronautics and Astronautics
11 Technical Paper Thermal Decomposition of a Model Endothermic Fuel. Preliminary Study Before Testing in the MPP-LAERTE Supersonic Combustion Test Bench

M. Sicard, B. Raepsaet, F. Ser, C. Masson

American Institute of Aeronautics and Astronautics
6 Conference Proceedings CNES reliability approach for the qualification of MEMS for space

Pressecq,F., Lafontan,X., Perez,G., Fortea,J.-P.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Optical MEMS reliability in space environment [6186-24]

Rigaud S., Quadri G., Gilard O., Nicot J. M

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12