Strength of signal flow in circuit simulation and its application

Strength of signal flow in circuit simulation and its application

Author(s):

Chen, C.-J. ( Chinese Culture University (Taiwan) )
Tai, W.-P.
Sun, J.-D.

Publication title:

Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4755

Pub. Year:

2002

Page(from):

374

Page(to):

384

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819445186 [0819445185]

Language:

English

Call no.:

P63600/4755

Type:

Conference Proceedings

Details

TDL ID:	ZA00012592
Series ID:	PA00000029
Conf. info. (Name):	Design, test, integration, and packaging of MEMS/MOEMS
Conf. info. (Number):	2002
Conf. info. (Venue):	Cannes, France
Conf. info. (Date):	2002.05.06-2002.05.08

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