Characteristics of residues and optical change of HT PSM during stepwise west cleaning and optimization of HT PSM cleaning process
- Author(s):
Jeong, W.-G. ( PKL (Korea) ) Kim, D.-W. Park, C.-M. An, K.-W. Lee, D.-H. Kim, J.-M. Choi, S.-S. Jeong, S.H. - Publication title:
- Photomask and Next-Generation Lithography Mask Technology IX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4754
- Pub. Year:
- 2002
- Page(from):
- 597
- Page(to):
- 605
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819445179 [0819445177]
- Language:
- English
- Call no.:
- P63600/4754
- Type:
- Conference Proceedings
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