Blank Cover Image

Modelling of Self - Heating Effects in SiGe-HBTS

Author(s):
Publication title:
Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001)
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4746
Pub. Year:
2002
Vol.:
VOL-1
Page(from):
718
Page(to):
720
Pages:
3
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445001 [0819445002]
Language:
English
Call no.:
P63600/4746
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings RF Applications of SiGe -HBTs

Maiti,C.K.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings Effects of the relative positions between pn junction interface and SiGe-Si interface in SiGe/Si HBT

Xu,C., Shen,C., Chen,J., Zou,D., Wei,H., Luo,J., Li,J., Zhou,J., Dong,X.

SPIE - The International Society for Optical Engineering
2 Conference Proceedings Deposition of Stoichiometric SiO2 on Silicon-Germanium Strained Layers

Senapati,B., Maikap,S., Bera,L.K., Maiti,C.K.

SPIE - The International Society for Optical Engineering
8 Conference Proceedings Low-Temperature Modeling of SiGe HBTs Using SCORPIO

Richey, D.M., Cressler, J.D., Joseph, A.J., Jaeger, R.C.

Electrochemical Society
3 Conference Proceedings Fabrication of Planar Inductor on Low Resistivity Silicon Substrates for RF Applications

Senapati,B., Bera,L.K., Banerjee,H.D., Maiti,C.K.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Accuracy assessment of compact RF noise models for SiGe HBTS by hydrodynamic device simulation (Invited Paper)

Jungemann, C., Neinhus, B., Meinerzhagen, B., Dutton, R. W.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Oxidation Studies on Strained SiGe Layer Using Microwave Oxygen Plasma

Mukhopadhyay,M., Ray,S.K., Maiti,C.K.

SPIE-The International Society for Optical Engineering, Narosa
10 Conference Proceedings Modeling of Lossy MOS Capacitors on Ge-Rich Si0.15Ge0.85 Substrates

M.K. Bera, R. Das, S. Chakraborty, S. Saha, C.K. Maiti

Electrochemical Society
5 Conference Proceedings Silicon Heterostructure Field Effect Transistors : Status and Trends

Maiti, C.K.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Effects of Proton Radiation on Device Modeling of SiGe Power HBTs

N. Jiang, Z. Ma, P. Ma, M. Racanelli

Electrochemical Society
6 Conference Proceedings Temperature Dependence of Electrical Properities of Ultrathin Nitrided Oxide Grown on Strained-SiGe by Rapid Thermal Oxidation

Samanta, S.K., Chatterjee, S., Bera, L.K., Banerjee, H.D., Maiti, C.K.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Dielectric Relaxation and Defect Generation Under Pulsed and Constant Voltage Stressing of Ultrathin TiO2 Films on …

M.K. Bera, S. Saha, C.K. Maiti

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12