Adaptive sequential Bayesian classification using Page's test

Adaptive sequential Bayesian classification using Page's test

Author(s):

Lynch, R.S., Jr. ( Naval Undersea Warfare Ctr. (USA) )
Willett, P.K. ( Univ of Connecticut (USA) )

Publication title:

Sensor fusion : architectures, algorithms, and applications VI : 3-5 April 2002, Orlando, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4731

Pub. Year:

2002

Page(from):

1

Page(to):

9

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444813 [0819444812]

Language:

English

Call no.:

P63600/4731

Type:

Conference Proceedings

Details

TDL ID:	ZA00012566
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Sensor fusion
Conf. info. (Number):	2002 : 6th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2002.04.03-2002.04.05

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