Blank Cover Image

Nonlinear feature extraction for MMW image classification: a supervised approach

Author(s):
Publication title:
Automatic target recognition XII : 2-4 April 2002, Orlando, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4726
Pub. Year:
2002
Page(from):
353
Page(to):
363
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819444769 [0819444766]
Language:
English
Call no.:
P63600/4726
Type:
Conference Proceedings

Similar Items:

Maskall,G.T., Webb,A.R.

SPIE-The International Society for Optical Engineering

Wu, X.-J., Yang, J.-Y., Wang, S.-T., Liu, T.-M.

SPIE-The International Society for Optical Engineering

Britton,A., Copsey,K.D., Maskall,G.T., Webb,A.R., West,K.

SPIE - The International Society for Optical Engineering

Gilhuijs,K.G.A., Giger,M.L., Bick,U.

SPIE-The International Society for Optical Engineering

Li, T., Wang, Y., Chen, Z., Wang, R.

SPIE-The International Society for Optical Engineering

Chang,K., Ghosh,J.

SPIE-The International Society for Optical Engineering

Denton,W., Jackson,R., Lawlor,C., Britton,A., Webb,A.

SPIE - The International Society for Optical Engineering

Lester,E.D., Whitaker,R.T., Abidi,M.A.

SPIE-The International Society for Optical Engineering

Tian, Q., Yu, J., Rui, T., Huang, T. S.

SPIE - The International Society of Optical Engineering

11 Conference Proceedings Flight test of a MMW imaging radarometer

Ewen,D., Huddleston,D.G., Smith,R.M., Belcher,B.W.

SPIE-The International Society for Optical Engineering

Li,T., Wang,Y., Chen,Z., Wang,R.

SPIE-The International Society for Optical Engineering

Y. Sun, G.T. Schuster, K. Sikorski

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12