Advanced imaging sensors at Rockwell Scientific Company (Invited Paper)
- Author(s):
Montroy, J.T. ( Rockwell Scientific Co., LLC (USA) ) Garnett, J.D. Cabelli, S.A. Loose, M. Joshi, A.B. Hughes, G.W. Kozlowski, L.J. Haas, A.K. Wong, S.S. Zandian, M. Chen, A.C. Pasko, J.G. Farris, M.C. Cabelli, C.A. Cooper, D.E. Arias, J.M. Bajaj, J. Vural, K. - Publication title:
- Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4721
- Pub. Year:
- 2002
- Page(from):
- 212
- Page(to):
- 226
- Pages:
- 15
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444714 [0819444715]
- Language:
- English
- Call no.:
- P63600/4721
- Type:
- Conference Proceedings
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