Exposure schedule scheme for uniform intensities of the reconstructed beams in VHOE-based muliview 3D display system

Exposure schedule scheme for uniform intensities of the reconstructed beams in VHOE-based muliview 3D display system

Author(s):

Gu, J.-S. ( Kwangwoon Univ. (KOREA) )
Kim, S.-C.
Cho, B.-C.
Kim, E.-S.

Publication title:

Cockpit displays IX : displays for defense applications : 2-5 April 2002, Orlando, [Florida]

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4712

Pub. Year:

2002

Page(from):

418

Page(to):

425

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444622 [0819444626]

Language:

English

Call no.:

P63600/4712

Type:

Conference Proceedings

Details

TDL ID:	ZA00012547
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Cockpit displays
Conf. info. (Number):	2002 : 9th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2002.04.02-2002.04.05

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