Capacitance sensitivity distributions model and image reconstruction in electrical capacitance tomography

Capacitance sensitivity distributions model and image reconstruction in electrical capacitance tomography

Author(s):

Chen, D. ( Harbin Univ. of Science and Technology (China) )
Zheng, G.
Yu, X.

Publication title:

Thermosense XXIV : 1-4 April 2002, Orlando, [Florida] USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4710

Pub. Year:

2002

Page(from):

686

Page(to):

690

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444608 [081944460X]

Language:

English

Call no.:

P63600/4710

Type:

Conference Proceedings

Details

TDL ID:	ZA00012545
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : International Conference on Thermal Sensing and Imaging Diagnostic Applications
Conf. info. (Number):	2002
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2002.04.01-2002.04.04

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