Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy
- Author(s):
- Druffner, C.J. ( Univ. of Dayton (USA) )
- Sathish, S.
- Publication title:
- Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4703
- Pub. Year:
- 2002
- Page(from):
- 105
- Page(to):
- 113
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444516 [0819444510]
- Language:
- English
- Call no.:
- P63600/4703
- Type:
- Conference Proceedings
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