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Structural integrity monitoring of composite patch repairs using wavelet analysis and neural networks

Author(s):
Publication title:
Smart structures and materials 2002 : smart structures and integrated systems : 18-21 March 2002, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4701
Pub. Year:
2002
Page(from):
156
Page(to):
166
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819444493 [0819444499]
Language:
English
Call no.:
P63600/4701
Type:
Conference Proceedings

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