Blank Cover Image

Verification of clinical test objects for diagnostic quality-guaranteed CRT monitor based on the visual evaluation

Author(s):
Ishigaki, T. ( Nagoya Univ. School of Medicine (Japan) )
Ikeda, M.
Usami, H.
Hidano, S.
Shimamoto, K.
Kodera, Y.
1 more
Publication title:
Medical Imaging 2002: Image Perception, Observer Performance, and Technology Assessment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4686
Pub. Year:
2002
Page(from):
347
Page(to):
354
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819444318 [0819444316]
Language:
English
Call no.:
P63600/4686
Type:
Conference Proceedings

Similar Items:

Horii, A., Takamura, M., Ichikawa, K., Kodera. Y., Ikeda, M., Ishigaki, T.

SPIE - The International Society of Optical Engineering

Tsukamoto, A., Yamada, S., Tomisaki, T., Tanaka, M., Sakaguchi, T., Asahina, H., Suzuki, K., Ikeda, M.

SPIE - The International Society of Optical Engineering

A. Shima, H. Shimizu, Y. Mori, M. Sagawa, K. Konishi, R. Fujita, T. Ishigaki, N. Tega, K. Kobayashi, S. Sato, Y. …

Trans Tech Publications

Roehrig,H., Krupinski,E.A., Furukawa,T.

SPIE-The International Society for Optical Engineering

Okusako, K., Shogaki, M., Tanaka, K., Yokoyama, K., Ichida, T., Okuyama, K., Kudoh, H., Tanaka, S., Nakamura, K., Ikeda, …

SPIE-The International Society for Optical Engineering

Kariya, M., Yamanaka, E., tanaka, S., Ikeda, T., Yamaguchi, S., Hashimoto, K., Itoh, M., Kobayashi, H., Kawashima, T., …

SPIE - The International Society of Optical Engineering

Ikeda, M., Ishigaki, T., Yamauchi, K.

SPIE-The International Society for Optical Engineering

Hattori,T., Ishigaki,T., Shimamoto,K., Sawaki,A., Ishiguchi,T., Kobayashi,H.

SPIE - The International Society for Optical Engineering

Hashimoto, K., Fujise, H., Nojima, S., Ito, T., Ikeda, T.

SPIE - The International Society of Optical Engineering

Y. Kodera, K. Badger, E. Gallagher, S. Akima, M. Lawliss, H. Ikeda, I. Stobert, Y. Kikuchi

SPIE - The International Society of Optical Engineering

S. Wada, M. Ohkubo, M. Kunii, T. Matsumoto, K. Murao, K. Awai, M. Ikeda

SPIE - The International Society of Optical Engineering

J. Yoon, K. Kim, N. Kong, H. Kim, T. You, S. Jung, G. Han, M. Lim, H. Shin, I. Chung

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12