New approaches for measuring changes in the cortical surface using an automatic reconstruction algorithm

New approaches for measuring changes in the cortical surface using an automatic reconstruction algorithm

Author(s):

Pham, D.L. ( NIA/National Institutes of Health (USA) )

Han, X. ( Johns Hopkins Univ. (USA) )

Rettmann, M.E.

Xu, C. ( Siemens Corporate Research, Inc. (USA) )

Tosun, D. ( Johns Hopkins Univ. (USA) )

Resnick, S.M. ( NIA/National Institutes of Health (USA) )

Prince, J.L. ( Johns Hopkins Univ. (USA) )

2 more

Publication title:

Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4684

Pub. Year:

2002

Vol.:

Part One

Page(from):

191

Page(to):

200

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819444295 [0819444294]

Language:

English

Call no.:

P63600/4684

Type:

Conference Proceedings

Details

TDL ID:	ZA00012513
Series ID:	PA00000029
Conf. info. (Name):	Medical Imaging
Conf. info. (Number):	2002
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2002.02.24-2002.02.28

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