Diffraction-enhanced imaging utilizing different crystal reflections at Elettra and NSLS

Diffraction-enhanced imaging utilizing different crystal reflections at Elettra and NSLS

Author(s):

Rigon, L. ( Univ. degli Studi di Trieste (Italy) )
Zhong, Z. ( Brookhaven National Lab. (USA) )
Arfelli, F. ( Univ. degli Studi di Trieste (Italy) )
Menk, R.H. ( Sincrotrone Trieste SCpA (Italy) )
Pillon, A. ( Univ. degli Studi di Trieste (Italy) )

Publication title:

Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4682

Pub. Year:

2002

Page(from):

255

Page(to):

266

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819444271 [0819444278]

Language:

English

Call no.:

P63600/4682

Type:

Conference Proceedings

Details

TDL ID:	ZA00012511
Series ID:	PA00000029
Conf. info. (Name):	Medical Imaging
Conf. info. (Number):	2002
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2002.02.24-2002.02.26

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