Statistical properties of x-ray CT and MRI: from imaging physics to image statistics

Statistical properties of x-ray CT and MRI: from imaging physics to image statistics

Author(s):

Lei, T. ( Univ. of Pennsylvania (USA) )
Udupa, J.K.

Publication title:

Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4682

Pub. Year:

2002

Page(from):

82

Page(to):

93

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

16057422

ISBN:

9780819444271 [0819444278]

Language:

English

Call no.:

P63600/4682

Type:

Conference Proceedings

Details

TDL ID:	ZA00012511
Series ID:	PA00000029
Conf. info. (Name):	Medical Imaging
Conf. info. (Number):	2002
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2002.02.24-2002.02.26

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