Geometrical features of transformed phase masks in the optical/digital device for identification of credit cards

Geometrical features of transformed phase masks in the optical/digital device for identification of credit cards

Author(s):

Muravsky, L.I. ( Karpenko Physico-Mechanical Institute (Ukraine) )
Kulynych, Y.P.
Maksymenko, O.P.
Voronjak, T.I.
Kostyukevych, S.O. ( Institute of Semiconductor Physics (Ukraine) )

Publication title:

Optical Security and Counterfeit Deterrence Techniques IV

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4677

Pub. Year:

2002

Page(from):

392

Page(to):

399

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444172 [0819444170]

Language:

English

Call no.:

P63600/4677

Type:

Conference Proceedings

Details

TDL ID:	ZA00012506
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Optical security and counterfeit deterrence techniques
Conf. info. (Number):	2002 : 4th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.23-2002.01.25

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