Proton radiation damage in high-resistivity n-type silicon CCDs
- Author(s):
Bebek, C.J. ( Lawrence Berkeley National Lab. (USA) ) Groom, D.E. Holland, S.E. Karcher, A. Kolbe, W.F. Lee, J.S. Levi, M.E. Palaio, N.P. Turko, B.T. Uslenghi, M.C. Wagner, M.T. Wang, G. - Publication title:
- Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4669
- Pub. Year:
- 2002
- Page(from):
- 161
- Page(to):
- 171
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819444097 [081944409X]
- Language:
- English
- Call no.:
- P63600/4669
- Type:
- Conference Proceedings
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