Analysis of capacitance sensitivity distributions and image reconstruction in electrical capacitance tomography

Analysis of capacitance sensitivity distributions and image reconstruction in electrical capacitance tomography

Author(s):

Chen, D. ( Harbin Univ. of Science and Technology (China) )
Zheng, G.
Yu, X.
Wang, Y. ( Heilongjiang Provincial Metrology Institute (China) )
Zhou, T.

Publication title:

Color imaging : device-independent color, color hardcopy, and applications VII : 22-25 January, 2002, San Jose, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4663

Pub. Year:

2002

Page(from):

355

Page(to):

359

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444035 [0819444030]

Language:

English

Call no.:

P63600/4663

Type:

Conference Proceedings

Details

TDL ID:	ZA00012491
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Color imaging
Conf. info. (Number):	2002 : 7th
Conf. info. (Venue):	San Jose, USA
Conf. info. (Date):	2002.01.22-2002.01.25

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