Oxide VCSEL reliability qualification at Agilent Technologies

Oxide VCSEL reliability qualification at Agilent Technologies

Author(s):: Herrick, R.W. ( Agilent Technologies (USA) )
Publication title:: Vertical-Cavity Surface-Emitting Lasers VI
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 4649
Pub. Year:: 2002
Page(from):: 130
Page(to):: 141
Pages:: 12
Pub. info.:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819443885 [0819443883]
Language:: English
Call no.:: P63600/4649
Type:: Conference Proceedings

Details

TDL ID:	ZA00012477
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Vertical-cavity surface-emitting lasers
Conf. info. (Number):	2002 : 6th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.23-2002.01.24

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