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Trace gas analysis by diode laser cavity ring-down spectroscopy

Author(s):
Yan, W.-B. ( Tiger Optics,LLC. (USA) )  
Publication title:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4648
Pub. Year:
2002
Page(from):
156
Page(to):
164
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443878 [0819443875]
Language:
English
Call no.:
P63600/4648
Type:
Conference Proceedings

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