Mapping of current and heat flows in IR light-emitting devices and lasers

Mapping of current and heat flows in IR light-emitting devices and lasers

Author(s):: Malyutenko, V.K. ( Institute of Semiconductor Physics (Ukraine) )
Publication title:: Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 4648
Pub. Year:: 2002
Page(from):: 43
Page(to):: 47
Pages:: 5
Pub. info.:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819443878 [0819443875]
Language:: English
Call no.:: P63600/4648
Type:: Conference Proceedings

Details

TDL ID:	ZA00012476
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Test and measurement applications of optoelectronic devices
Conf. info. (Number):	2002
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.21-2002.01.22

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