Bayesian model for the failure rate estimation of photonic components

Bayesian model for the failure rate estimation of photonic components

Author(s):

Kang, C.W. ( Corning Inc. (USA) )
Soltysik, G.E.
Denson, W.

Publication title:

Optical fiber and fiber component mechanical reliability and testing II : 21 January 2002, San Jose, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4639

Pub. Year:

2002

Page(from):

127

Page(to):

135

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443786 [0819443786]

Language:

English

Call no.:

P63600/4639

Type:

Conference Proceedings

Details

TDL ID:	ZA00012467
Series ID:	PA00000029
Conf. info. (Name):	SPIE LASE : Optical fiber and fiber component mechanical reliability and testing
Conf. info. (Number):	2002 : 2nd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2002.01.21

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