Absorption and emission properties of F-center-OH- defect pairs in cesium halides
- Author(s):
Kong, C. ( Chongqing Normal College (China) ) Ma, Y. Dong, M. Wang, W. ( Chongqing Univ. (China) ) Liao, K. Xu, J. - Publication title:
- Micromachining and Microfabrication Process Technology and Devices
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4601
- Pub. Year:
- 2001
- Page(from):
- 248
- Page(to):
- 255
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819443403 [0819443409]
- Language:
- English
- Call no.:
- P63600/4601
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Investigation of the properties and stability of microcavity devices based on LPPP heterojunction structure
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
2
Conference Proceedings
Ultrafine-grain silver-halide emulsions and their properties in reflection holography
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Relations of two-photon absorption property and molecular structure in phenylenevinylene chromophores
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Raman scattering and infrared absorption of silicon nanocrystals in silicon oxide matrix
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
UV/VIS liquid-core optical fiber long lightpath absorption system for spectrophotometer
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Light-emitting properties from the heterostructure of ladder-tyep poly(p-phenylene)
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Highly Selective Photoenhanced Wet Etching of GaN for Defect Investigation and Device Fabrication
Materials Research Society |
SPIE - The International Society of Optical Engineering |