Measurement of the behaviors of the optoelectron in photosensitive material by dielectric spectrum technology
- Author(s):
- Publication title:
- Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4600
- Pub. Year:
- 2001
- Page(from):
- 96
- Page(to):
- 100
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819443397 [0819443395]
- Language:
- English
- Call no.:
- P63600/4600
- Type:
- Conference Proceedings
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