Sensitivity of the a-C:H gate pH-ISFET

Sensitivity of the a-C:H gate pH-ISFET

Author(s):

Chou, J.C. ( National Yunlin Univ. of Science and Technology (Taiwan) )
Tsai, H.-M.

Publication title:

Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4600

Pub. Year:

2001

Page(from):

55

Page(to):

64

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819443397 [0819443395]

Language:

English

Call no.:

P63600/4600

Type:

Conference Proceedings

Details

TDL ID:	ZA00012428
Series ID:	PA00000029
Conf. info. (Name):	Advances in microelectronic device technology
Conf. info. (Number):	2001
Conf. info. (Venue):	Nanjing, China
Conf. info. (Date):	2001.11.07-2001.11.09

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