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Defect formation/relaxation processes in Ge-doped SiO2 by ArF laser irradiation

Author(s):
Publication title:
Design, fabrication, and characterization of photonic devices : 27-30 November 2001, Singapore
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4594
Pub. Year:
2001
Page(from):
300
Page(to):
307
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443243 [0819443247]
Language:
English
Call no.:
P63600/4594
Type:
Conference Proceedings

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